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Dear all, I sent an email to afm.support@bruker.com but I did not get an answer...Could you help me understand if anyone had the opportunity to use Nanoscope Analysis to extract QNM force curves. The comparison of the data from the 2 versions 1.80 and 1.40 shows (Deflection vs Ramp) and (Deflection & Time) curves totally different. The big problem
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Dear all, I sent an email to afm.support@bruker.com but I did not get an answer... Could you help me understand if anyone had the opportunity to use Nanoscope Analysis to extract QNM force curves. The comparison of the data from the 2 versions 1.80 and 1.40 shows curves (Deflection vs Ramp) totally different. The big problem is that these 2 curves do
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Hi, I need your help to convert the 65536 force curves obtained by PFQNM into ASCII. Until then, I have always used Nanoscope analysis to extract the curves but unfortunately the number of files is limited to 2000. To process all the curves, I had to do the packet conversion of 2000, which is really very very laborious. Would anyone have a routine to
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Hi Ian, Thank you for you answer. I will try next week. I have another question regarding to electrical connexions. Do you think that using a silicium wafer (one polished side and another silver painted) is a proper substrate. The measurement of surface potential is performed on a sample of clay particles embedded in the starch film deposited on Si
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I need your help to tell me how I could unambiguously measure the surface potential . We rencently acquired in our laboratory an Dimension Fastscan w ith Fastscan and Icon sacnners. I just begins to perform measurements of the surface potential with the probes Icon SCM- PIT or MESP . The procedure is as follows: - Step 1: Topography in tapping mode