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Innovation with Integrity Continuing the Nanoelectrical Revolution April 2013 Bruker has a history of innovation and leadership in the area of semiconductor electrical characterization with industry-leading SSRM, SCM, CAFM, and TUNA application modules for Dimension® and MultiMode® and AFM platforms...
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Nice paper just published on Graphene using Dimension Icon by Tim Burnett,Rositza Yakimova,and Olga Kazakova of National Physical Laboratory and Linkoping University. View at: nl200581g ABSTRACT: Local electrical characterization of epitaxial graphene grown on 4H-SiC(0001) using electrostatic force microscopy...
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All, Nice paper on high resolution MFM by Morgan et. al. in Nature Physics. Data taken using the MM and Dimension. Check it out at: http://www.nature.com/nphys/journal/v7/n1/full/nphys1853.html Steve
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