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  • Dimension Edge and Innova data format

    The question came up again on how to read the *.flt files generated by the Dimension Edge and Innova. Here is a pdf explaining the data structure. Please note that the data are stored in "float" and NOT in "integer". Stefan Data Format.pdf
    Posted to SPM Digest (Forum) by Anonymous on Tue, Apr 30 2013
  • Proprietary High-Contrast Probe Tips on Innova-Iris AFM Enable First Complete Commercial TERS Solution

    Innovation with Integrity Proprietary High-Contrast Probe Tips on Innova-IRIS AFM Enable First Complete Commercial TERS Solution April 2013 The single biggest issue preventing further adoption of the powerful Tip-Enhanced Raman Spectroscopy (TERS) technique is the lack of available high-performance probes...
    Posted to Nanovations (Forum) by Tracy Krainer on Thu, Apr 4 2013
  • Re: Innova- Scanning thermal microscopy SThM steps

    Hi Evangelia, I assume that you are using the analog thermal box for your measurement. That box has been superceeded for quite some years by a newer software controlled version. Having said that, it always worked fine if one did not mind setting the resistance settings "by hand". I dropped...
    Posted to SPM Digest (Forum) by Anonymous on Wed, Jun 20 2012
  • Re: Scratching Lithography using Innova

    Hi, Yes there is a way. When you peform a lithography experiment selecting the "by depth" option, the system will turn the z-feedback off and raise the sample by the depth you specified. If you have tilt on your sample this can of course lead to errors in depth. In order to compensate for that...
    Posted to SPM Digest (Forum) by Anonymous on Tue, Dec 6 2011
  • Re: Local anoidic oxidation lithography

    Hi Saumil, That chip carrier that you pointed out allows you to bias the tip. With the regular carrier the tip is always grounded. In order to apply a bias (which the software always allows) you have to route the bias voltage to the sample. So if you can live with biasing the sample you don't need...
    Posted to SPM Digest (Forum) by Anonymous on Tue, Nov 15 2011
  • Re: Force distance measurements with Innova

    Hi dmr42c, You may want to read up on elastic deformation and the St. Venant's law. As a simple rule of thumb you can assume that the tip deforms an area roughly 10x the diameter. So for a 5nm tip you will need a sample >50nm thick to be free from substrate effects. Best, Stefan
    Posted to SPM Digest (Forum) by Anonymous on Wed, Nov 2 2011
  • Re: CAFM

    If possible I use silver epoxi or similar, indium works too to achieve proper conductivity from sample to metal puck. If already mounted with tape you may try to paint some silver over the edges. The Innova has a slight offset in the Bias voltage so 0V may not be 0V. You may want to measure that in order...
    Posted to SPM Digest (Forum) by Anonymous on Tue, Oct 18 2011
  • Re: 2D array of locations with probe positioning

    Hi Zhuoyang, It is actually quite easy to generate an array of points. When you select the frame symbol in the probe positioning dialog a box pops up to ask you to select the number of points in the rectangle. After that you can position the reactangle in your image and select the size. If you are happy...
    Posted to SPM Digest (Forum) by Anonymous on Tue, Jun 28 2011
  • Re: Reducing imaging forces

    Hi Zhuoyang, In contact mode it is indeed as you say. Once in feedback one can reduce the imaging force until the cantilever alsmost pulls off the surface. For practical reasons you probably want to reduce uintil the cantilever pulls off and then go back into contact and stay with a setpoint a bit above...
    Posted to SPM Digest (Forum) by Anonymous on Tue, May 24 2011
  • Re: Local anoidic oxidation lithography

    Hi Narenda, On the Innova you can to use the "Nanoplot" option for lithographic experiments. In order to start Nanoplot you simply "right click" on any previously acquired image and select the "send to Nanoplot" option. In the Nanoplot setting you want to select the type...
    Posted to SPM Digest (Forum) by Anonymous on Wed, May 11 2011
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