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Download from: AN134-RevA0-Survey_Screening-Dynamics_HighSpeed_Atomic_Force_Microscopy-AppNote (LoRes).pdf Abstract: When compared to other common microscopy techniques (optical, SEM, TEM), the atomic force microscope’s (AFM’s) broad potential for nanoscale imaging and characterization of numerous physical surface properties has been somewhat
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When compared to other common microscopy techniques (optical, SEM, TEM), the atomic force microscope’s (AFM’s) broad potential for nanoscale imaging and characterization of numerous physical surface properties has been somewhat offset by its slow imaging speed. Thus, the AFM has sometimes been seen as a powerful “specialty tool”
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Hi Dalia, I agree with RW’s post and to provide a little more detail. In our autotune routine we do set the Phase to zero at resonance, rather than leave it at the perhaps expected 90deg. I should note that you do have the option to not do this (by not hitting the “zero phase” button, or by doing a manual tune.) In your original post
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Mirela, Check out SPIP form Image Metrology (http://www.imagemet.com/) and Punias (http://punias.free.fr/). Both would be good places to start. Steve
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Sales Applications Engineer – Bruker Nano Surfaces Division - UK Bruker Nano Surfaces Division has an open position in UK office for an application engineer covering Atomic Force Microscopy (AFM), stylus and optical profiler product lines. The position is based in Cambridge, England and will report to the UK sales manager. It will cover, but not
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Peak Force QNM Frequently Asked Questions
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CNMS_SPM_Workshop2011_Planv8a.pdf Center for Nanophase Materials Sciences Workshop Advanced Scanning Probe Microscopies at the CNMS: Materials Structure and Function from Atomic to Micron Scales September 21-22, 2011 The Center for Nanophase Materials Sciences Oak Ridge National Laboratory, Oak Ridge, TN USA Center for Nanophase Materials Sciences Workshop
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Lauren, This may also be a laser interference effect. The samples that you are running (polymer coating on metal substrate) sound like they may be highly reflective. Try to minimize the interference through better laser alignment (maximize the sum). Also try OLTESPA, or if you can tolerate higher force OTESP (they both are a little wider). You can also
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PS: A good test of the robustness of a system is to scan Celgard® in different orientations; here is an even faster video (23Hz) where the mesh is perpendicular to the scan. Enjoy, Steve
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It’s good to see some community attempts at replicating the performance of the Dimension FastScan. The video is of a 1um, 512x512, 23Hz, scan of Celgard® taken with the Dimension FastScan. This demonstration is over twice as fast as the 10Hz video we showed previously, additionally we demonstrate the Celgard® with the mesh oriented a couple