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You can change the Deflection Limit to help improve the inphase bit noise, but you must make sure that the absolute deflection does not go outside the range (eg. if the range is 4V, deflection should never go to >2V or <-2V). If you have PeakForce QNM, there will also be a Dissipation Limit in the PF Mapping Limits list. To see these parameters
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Hi Wilson, The software implements two models: DMT for spherical tips and Sneddon for conical tips. Depending on the depth of the indentation and the precise shape of the tip, one or the other of these models will be more appropriate. Note that these models only consider elastic deformation. If your sample has other active deformation mechanisms (plastic
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Hi Wilson, I answered this in the other thread. Please look here: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/forums/p/1063/2831.aspx#2831 --Bede
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Hi Sandeep, The difficulty was caused by the lack of analysis software, not any problem with the data acquisition (although you will need an accurate deflection sensitivity calibration obtained by ramping on a hard sample (like sapphire)). The latest version of Nanoscope Analysis has a function called 'indentation analysis' that can apply an
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I'm not aware of one, but I did a quick search in Google Scholar and came up with the following. I do not have a copy, so let me know if it is useful or interesting. --Bede Nakagawa, Y. “Scanning Tunneling Microscopy of Silicon Surfaces in Air: Observation of Atomic Images.” Journal of Vacuum Science & Technology A: Vacuum, Surfaces
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Hi Helene, If the retracting curve is lower than zero force, the curve is still fit (assuming that you have some points to fit -- the fit region is defined relative to the peak force and the adhesion point). All of the force separation curves that do not indicate increasing deformation with decreasing force are included (I called this 'negative
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Hi Lauren, Usually the behavior that you speak of results from the DMTModulus Limit being set too high. You are probably seeing bit noise. Please check the DMTModulus Limit and decrease it to ~ 10-100x the maximum value in the data channel. The limits are configured for the ScanAsyst-Air probe, so using a different probe usually requires some adjustment
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I'm afraid that there is currently no way to set limits as you suggest. That is a good idea. I will ask software if we can do this! --Bede
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Hi Chris, Add your images (image1.bmp or image2.tif) to the Bruker\NanoScopeAnalysis\SplashScreens directory. You should also add a text file with the same name, but ending with .txt.bin as a caption (image1.txt.bin or image2.txt.bin). When you look in the directory you should see some examples. Please be sure to back up your image and caption files
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Hi Helene, I'm not able to see your images, but I'll try to answer your questions anyway... 1. Nanoscope is not filtering the curves before fitting, but it does reject any curves that have force distance curves where the slope doesn't make sense (i.e. increasing deformation with decreasing force). In that case, the data will show the same