-
Nice paper just published on Graphene using Dimension Icon by Tim Burnett,Rositza Yakimova,and Olga Kazakova of National Physical Laboratory and Linkoping University. View at: nl200581g ABSTRACT: Local electrical characterization of epitaxial graphene grown on 4H-SiC(0001) using electrostatic force microscopy (EFM) in ambient conditions and at elevated
-
-
Our new Dimension FastScan Atomic Force Microscope (the world's fastest AFM) will enable you to scan once and get all the details you need. Contact Bruker today to see for yourself the difference FastScan can make in your application. Find more info at www.bruker.com/fastscan
-
PeakForce Tapping™ (PFT) and ScanAsyst™ (SA) are two Atomic Force Microsocope (AFM) imaging techniques that have been recently introduced by Bruker. In this application note we will explain the underlying physical background, fit PFT into the framework of existing AFM modes, and show the benefits of these new modes through application examples
-
We don’t have waviness in our analysis package so I am not completely sure, but a quick survey of the web seems to indicate waviness is the measure of absolute deviation of a surface at frequencies below what is considered roughness. By this definition, there is not an equation per-se because it is just a peak to peak measurement. Likewise, as
-
Lujie, Can you post the force curve to hep understand the issue? The raw file is always better, but a bitmap of the curve will also help. Here is a procedure to post files: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/forums/t/526.aspx Thanks, Steve
-
Iwei, The help section for Particle Analysis is very good (go to Help -> Help, and search Particle Analysis), and I think should answer your questions. I have also copied it below. If not, can you post your file and settings? Thanks, Steve You are here: Analysis Functions > Particle Analysis Particle Analysis The Particle Analysis command defines
-
This paper discusses fabrication and characterization of single-walled carbon nanotube (SWNT) AFM probes. By selectively deposit catalytic nanoparticles onto commercial AFM probes with silicon tips, we are able to grow SWNTs in the wafer scale, with 30-50% usable probe yield. We also discuss in detail about shortening of carbon nanotubes to achieve
-
I posted the relevant section here: p48-56 ONLY - NANOMAN VS NANOLITHOGRAPHY V7-D (013-413-000).pdf Email me if you need the entire manual. Steve
-
Example 2: Anodic Oxidation on Silicon Anodic oxidation in NanoMan works well when using the TAPPING mode for imaging and the CONTACT mode for oxidation. See Figure 5ao, Page 64, in the Bitmap Import and Mode Switching example for typical path settings for anodic oxidation using this new method. Using a metal coated tapping tip, such as an SCM-PIT or