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Innovation with Integrity Bruker Fuels the Future of Graphene April 2013 AFM topography image showing wrinkles in graphene layers at area of interest. This modulus image shows fine structures with greater compliance seen as darker areas on the modulus map image. Atomic force microscopy has been part of graphene research since Andre Geim and Konstantin
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Innovation with Integrity Proprietary High-Contrast Probe Tips on Innova-IRIS AFM Enable First Complete Commercial TERS Solution April 2013 The single biggest issue preventing further adoption of the powerful Tip-Enhanced Raman Spectroscopy (TERS) technique is the lack of available high-performance probes. With the release of the new IRIS TERS Probes
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Innovation with Integrity Continuing the Nanoelectrical Revolution April 2013 Bruker has a history of innovation and leadership in the area of semiconductor electrical characterization with industry-leading SSRM, SCM, CAFM, and TUNA application modules for Dimension® and MultiMode® and AFM platforms.These techniques have been improved and further
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Innovation with Integrity Seeing at the Nanoscale Is Coming to a Venue Near You April 2013 After over a decade of extremely popular once-a-year conferences, Seeing at the Nanoscale is expanding to multiple locations in 2013. The year-on-year growing participation, interest, and valued interactions were a strong catalyst for Bruker's new regional
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Seeing at the Nanoscale 2013 with Nuance Don’t miss this opportunity to meet your peers, discover next-generation nanotechnology, and be the first to hear about the exciting trends and industry updates. This year’s conference features an incredible mix of visionaries—all ready to give you an insider’s view on the future of nanotechnology
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Normal 0 false false false EN-US JA X-NONE Michigan Technological University Postdoctoral Position: Atomic Force Microscopy (AFM) Department of Mechanical Engineering at Michigan Technological University has one open position for a postdoctoral research associate in the area of atomic force microscopy (AFM) studies of biological structures and living
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Product Support Engineer, Technical Leader, Atomic Force Microscopy Bruker Nano Surfaces Division seeks a Technical Lead for its industrial and research AFM product line located in Santa Barbara. The position has four primary responsibilities: · Resident system level expert on Bruker Atomic Force Microscopes (AFMs) and associated applications