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hello While going through one of the Application Support Bulletin By Bruker regarding nanoindentation calculations I found the following: "It is difficult to get Young's modulus with the NanoScope AFM nanoindenting technique. The modulus depends on the slope of the unloading curve of the indent and the indent force curves generated with this
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thanks stefan sir for the reference paper........
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hello peter sir Thanks a lot I will go trough your book.
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how elastic properties can be measured using AFM technique? can anyone provide some reference paper/literature ?
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hello In section menu of analysis commands there are two ways of analysis one by drawing cross section profile along line and measuring by putting markers and another one is FFT. I want to know how analysis can be done through FFT spectrum ( just below line profile in section). Please explain giving example of grid. Can anyone help me for this. Thanks
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hi chunzeng Li..... sure i can send ..plz give me your mail id..... Thanks Sandeep
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sorry stephen its again wastefull attempt....need ur help how to send attachment........... Thanks Sandeep
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hi. You have replied me on SPM digest, I could send the screen shot image over there. Here I have tried to attach my problem in pdf file as an attachment. Thanks Sandeep
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Hi I am sorry I am not able to attach images ....kindly guide me how to attach the images............ sandeep
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Normal 0 false false false false EN-IN X-NONE X-NONE MicrosoftInternetExplorer4 Hi Stephen Thanks for your reply. Here I am sending you stepwise what problem we are facing. I would like to mention recently we are using software version v 730 (Build R1Sr2.49416). We also have v720 (Build R1.30937). In v720 we are doing well in lithography. Here is the