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Marjan, Yes. If you read the application note carefully, you'll see that the AM mode has a worse resolution than FM mode. We have an online training video for this. Please go watch it: https://www.bruker.com/service/education-training/training-courses/afm-optical-training-courses.html Thanks, Teddy
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Hi Marjan, Yes, KPFM can work. For more detail, you can refer to the application note here: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/media/p/4037.aspx Thanks, Teddy
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Hi, 1. DMT model is used for the situation where the indentation depth is small compare to the tip radius. 2. Sneddon model is generally used for soft sample. Tip used generally has a radius around 10 nm. To use the Sneddon model, the indentation depth should be >30 nm for accuracy. 3. For the gap between these two model, situation would be more
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More notes from engineer. “ We have not measured that, but the customer might be able to get a rough estimate by using the dimensions of the FASTSCAN-A probe listed on the box and comparing the spot size to the probe size. The spot size will also vary for each system since the spot is manually focused, so there’s not one typical spot size
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Hi Krishnashish, See note here " the aperture diameter for the small spot size is 0.118” +0.002”/-0.000. Laser power is set to 1.15mW and the laser is focused manually to achieve maximum roundness with minimal shadow" Thanks, Teddy
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I'm checking this for you. Please follow up by sending email to afm.support@bruker.com
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Hi Peter, You can install " v531r1". Versions later than " v531r1" are for computers have motherboards after 2013, which are rare. Please contact afm.support@bruker.com for a link to download " v531r1" if you need it. Thanks, Teddy
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Hi, 1. The top right trace plot is tilted. Did you flatten the image? For the phase image, the real-time and off-line planefit functions should be set to "non2" 2. During the scanning, you can precisely control the lift height in the interleave scan. However, under the ramp mode, you can: (a) the tip is in contact with the sample, and you
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Hi Jimmy, We have several application notes that might be useful to you. I can send them to you if you can give me your email. In addition, you can find several useful webinars that are related to your questions here. Please follow the link below to find out the webinars. http://www.bruker.com/service/education-training/webinars/afm.html Topics below
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Being updated.... Marjan Kashfipour Research assistant at The University of Akron Hi all, is there anybody who can explain the relation of working function which is measured during KPFM mode of AFM and corrosion potential of the sample? I'm confused a little bit about it, some papers assume higher potential means more noble corrosion potential and