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  • Re: About tip qualification from characterizer image

    Hi, Fenny, You can send me your files and screen shot of your settings so that I can advise, you should have my email :) For average deformation, just a rough estimation will work, you can just use section analysis to get an idea of mean deformation. For bearing depth analysis, you need to set bearing area to be 50% under area percent (beside input
    Posted to SPM Digest (Forum) by Ang Li on Thu, Jan 19 2012
  • Re: Optimizing cantilever amplitude for imaging of biomolecules in fluid

    Hi Dejan, Since you are using tapping mode, you might need to calibrate the amplitude sensitivity instead of deflection sensitivity. You can either use TM amplitude or TM deflection plot to do so and I guess you already have got amplitude-distance curve so you can just update the amplitude sensitivity by linear fitting of the repulsive part of the curve
    Posted to SPM Digest (Forum) by Ang Li on Sun, Jan 8 2012
  • Re: Nanoscope Analysis tutorial for Nanoscope III software users?

    Hi, Chris, the help file of the software is pretty nicely self explained and demonstrated, if you still have some questions, you can post them here or contact a Bruker application.
    Posted to SPM Digest (Forum) by Ang Li on Sun, Dec 18 2011
  • Re: Question about imaging a biconcave sample and using the force scripting interface in Dimension Icon

    Hi, nhung, Your problems are not difficult to address, just some tricks will help, but to get the full understanding of the answer (not only the tricks but also their mechanism), you'd better contact a local bruker application expert and spend some time together to solve your problem more efficiently and clearly. In case you need contact information
    Posted to SPM Digest (Forum) by Ang Li on Wed, Dec 7 2011
  • Re: AFM Theory for Beginners

    Hi, Dmitry, the classic one I read at beginning was Atomic Force Microscopy in Cell Biology, Volume 68 (Methods in Cell Biology) http://books.google.com/books?id=gL9MpmcpwOUC&printsec=frontcover&source=gbs_ge_summary_r&cad=0#v=onepage&q&f=false and a good series of books are 'Applied Scanning Probe Methods' published since
    Posted to SPM Digest (Forum) by Ang Li on Fri, Dec 2 2011
  • Re: Image Oil Deposition on Surface

    Hi, if correctly calibrated, contrasst in deformation channel should also appear in modulus channel, usless your deflection sensitivity was not calibrated accurately. I guess you can roughly correlate the measured deformation to the thickness of your oil patches if you have very high indentation force to fully penetrate the oil layer. But a quantitative
    Posted to SPM Digest (Forum) by Ang Li on Fri, Dec 2 2011
  • Re: how to get absolute height histogram in nanoscope analysis software 1.40?

    Hi, Albert, You can find 'X Axis' in the control panel for plotting depth histogram and just simply switch it to 'Absolute' instead of default 'Relative', then you can get 'height histogram' you are referring to. LA
    Posted to SPM Digest (Forum) by Ang Li on Thu, Dec 1 2011
  • Re: PFQNM-sample kit

    Hi, Fangfang, I would like to take a look at your raw data on QNM of the two samples and tip check result if you have. You can send to my email at ang.li@bruker-nano.com LA
    Posted to SPM Digest (Forum) by Ang Li on Wed, Nov 23 2011
  • Re: DMT modulus

    sorry, Fangfang, I made a mistake in my last reply, you can check mean value in roughness analysis for the average modulus.
    Posted to SPM Digest (Forum) by Ang Li on Tue, Nov 22 2011
  • Re: DMT modulus

    Hi, Fangfang, You should not flatten modulus image, it will change your data. To get average, you can simply use roughness function to get Rq and Ra for your analysis. LA
    Posted to SPM Digest (Forum) by Ang Li on Tue, Nov 22 2011
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