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Hi Stefan, thanks for your reply. I thought that there was a software option to attenuate the tapping drive signal, but must have been mistaken. Best wishes, Nic
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Just a quick question - I'm using a Multimode on a NSIIIa controller with a basic extender. In older versions of the NS software there was an option to attenuate the cantilever drive signal by a factor of 8 (in the Microscope>Calibrate>Detector menu). This was useful for eliminating drive noise in tapping mode when cantilevers required very
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Mikromasch produce similar probes, and have a set of engage parameters here (approx half way down the page): http://www.spmtips.com/howto/res/hr I use similar parameters on a multimode with sharp tips, however I use a lower engage gain (0.1) and also set the pre-engage setpoint to 95%. The most important parameter is "sew tip" this MUST be
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Yes, this is relatively easy. If you just need some extra room in Z, the top (rotatable) part of the chuck can be removed by pulling it upwards with the vacuum off (easiest if you bring the stage right to the front of the granite area and remove the scanner from the dovetail first). If you need more room, or want to remove the stage entirely, this is
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The artefact you describe can be caused by the fact that the cantilever is not parallel with the surface. This means that moving the cantilever vertically (with your Z ramp) while in contact applies a force along the length of the cantilever. This force is balanced by the restistance of the tip sample contact to shear. On the approach, the tip-sample
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Hi Hao, I'm afraid I don't know about the optical fibre, but as it is only delivering white light for the top view optics I don't think the specification should matter too much - any old optical fibre of the correct diameter should be fine (though the white light source can get quite hot, so take care not to melt plastic fibres) In the UK
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Stefan's suggestion is probably the most straightforward method. Note that on nanoscope 3 and 4 systems, the cantilever deflection signal (as displayed in the software) is scaled after the SAM, so you will measure a different deflection voltage on the In0 channel of the SAM to that shown in the software. From my measurements, the software deflection
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Hi Bill, In the cases I've seen, if all the cables are connected correctly and the serial port configuration is correct but a fast scan error message is still coming up, it is usually a controller problem. I'm unable to advise you on what happens after you use the recovery disc as I've never attempted this. My best advice is to give you
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Hi Nikos, one common cause of this error message is if the small D connector that goes from one of the com ports at the back of the control computer to the "fast scan" port on the NSIV is not connected. Try checking the connector at both ends and restarting everything. Also check that the com port that you are using to connect to the "fast
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Hi Mark, I have not used FIB tips, but I do use a variety of probes with very delicate tips that require the engage parameters to be changed. The most important parameters in the tapping engage panel seem to be the engage gain (I usually reduce this to ~0.1 for delicate tips) and the engage test threshold (which I usually raise to ~500). Also, ensure