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Hi Ranna, Yes, it is possible that the tip could be contaminated and that the contamination is dominating the measurement. There are several methods for cleaning the probe. Most involve indenting a soft material such as gold or rubber with a high force. --Bede
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Hi Ranna, With AFM, hardness is usually evaluated based on the residual indentation left after the indent. It is usually defined as Hardness=Maximum load/projected area of the pit left by the indent. The Maximum load is just your ramp mode trigger (assuming you are using relative triggering and you have...
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Hi Sandeep, The difficulty was caused by the lack of analysis software, not any problem with the data acquisition (although you will need an accurate deflection sensitivity calibration obtained by ramping on a hard sample (like sapphire)). The latest version of Nanoscope Analysis has a function called...
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I'm happy to announce the latest version of NanoScope Analysis, version 1.40R2. For anyone not already familiar with it, NanoScope Analysis is a free software package for analyzing data collected using Bruker SPMs. This latest version includes a number of new features for force curve analysis: •...
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Hi Basavarja, As Stephan notes, both SPMLab and NanoScope software have simple controls in ramp mode where you can type in the approach rate or retract rate that you desire. These rates control the speed of the piezo during ramping, so they are indirectly related to the loading rate (which would presumably...
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Hello Gerard and Peter - I have used a Veeco Probes (https://www.veecoprobes.com/) FESP substrate and lever onto which was glued a pyramidal diamond probe from Micro Star (http://www.microstartech.com/) for imaging surface roughness between very tall (80 um) posts (the diamond pyramids were ~100um tall...