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Hi Luci, Yes, it is possible to do EFM while applying a DC volage to the tip and/or sample. Note however that the Kelvin loop will control the voltage on tip (typical) or sample, so you will only be able to apply to one of those 2 in this mode. You will have to find the 'Tip Bias Control' and 'Sample Bias Control' parameter settings
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Can you please describe the sample you are tyring to image: what type of material are the features made of + which imaging mode and tip model are you using? It is possible that the featues you are tyring to measure are smaller than the size of the tips, and you therefore have some tip/sample convolution effects. Using sharper tips or using optimized
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Hi Gerard, I might still have an old Multimode head. Contact me off-list (peter.dewolf@bruker-nano.com) to discuss the details. Regards, Peter
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Hi Isaias, There are several AFM users who perform their measurements on samples loaded in a tensile stress stage. As those stages can take up some space, and also add some weight - it is usually recommended to do these measurements on AFMs which have a 'scanning-tip' design (e.g. the Dimension series), rather than a 'scanning-sample'
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Hi Karine, Can you send me by regular email (at pdewolf@veeco.com) a bit more information on the applications you have for these parts + which controller platform you will use them on? There are a couple of versions for the parts you list, and I might be able to find you some 'used' parts. Best regards, Peter
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I've gone up to as high as 270C (and 350C in Vacuum) without a problem. Peter