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Lists key benefits to upgrading your old MultiMode. Every MultiMode can be upgraded.
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Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys, photovoltaic effects on solar cells, and surface analysis. KPFM, together with conductive AFM, have been recognized as the two most used nanoscale electrical characterization tools, complementing each
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Applications note #139 “AFM and Raman Spectroscopy – Correlated Imaging and Tip Enhanced Raman Scattering”: · Educates about AFM and Raman spectroscopy and explains the benefits of combining them in a straightforward way. · Highlights Bruker’s unique offerings in the field, the Innova-IRIS, Catalyst-IRIS, and ICON
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Kelvin probe force microscopy (KPFM, also known as surface potential microscopy) measures the work function, or electric potential, of materials or charges on the nanometer length scale. Despite much effort, KPFM has suffered from its inability to obtain consistent measurements of absolute work-functions in ambient conditions. Contamination, oxidation
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Combines Bruker's unique PeakForce Tapping technology with FM KPFM detection to enable quantitative, highest resolution workfunction mapping with correlated nanomechanics.
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Enabling characterization of organic photovoltaics by photoconductive AFM. Leverages Dimension Icon performance and Bruker exclusive PeakForce TUNA for highest resolution conductivity imaging on soft and fragile samples. Compatible with industry standard solar simulators.
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Correlated Imaging & Latest TERS Advances
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Bruker’s closed electrochemical cells enable a wide range of new electrochemical atomic force microscopy (ECAFM) research. Available for Dimension Icon® and Dimension Edge™ AFMs, the cells have been designed for the widest solvent compatibility and ease of setup, even inside a glove box. In addition, Bruker’s unique ScanAsyst®
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