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Hi Arthur, In order to do EC-AFM, you will need a bipotentiostat and an EC cell which can hold your sample as well as a counter & reference electrode. If you also want to do SECM (i.e. with an electrochemically active tip), you will also need SECM probes & probe holder For some of our AFM modesl we have a dedictwed bipotentiostat whcih integrates
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Hi Deepak, Thanks again for providing more detial on this application, in our direct communication. I am glad to hear things work fine now. Also thanks for pointing out that the correct BNC is the Aux-B one, and not the AUX-D one. Peter
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Hi Deepak, Can you please email me (peter.dewolf <at> bruker.com) tyour contact info & the details of the configuraiton you are using (controller / extender type / conductive-AFM module type / SAM type)? When trying to display the AuxD signal on an external oscilloscope, make sure to connect to the AUXD-OUTPUT BNC, and not the INPUT one. Peter
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Hi Sjoerd, The first curve never seem to reach the 2nN trigger value, maybe because there is a huge adhesion peak (5nN), whcih I do not see in the 2nd cruev. Could there be any specific reason for this big adhesion upon the first curve? do you see the same behavior if you colelct individual curves 1-by-1 in a manual way? Peter
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Hi Sjoerd, Can you share the key settings for your force measurements, please? It looks like the first curve 'stopped' at a quite low maximum force, while the second one went to a higher force level. Maybe there is some optimization on the force triggering to be done? Peter
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In Peak Force Tapping, the 'amplitude' indeed refers to the zero-peak distance value (or 'A' in Asin(wt)). Both the force curves displayed in realtime and the ones stored when using peakforce capture reflect this, in the same way (the total Z range covers 2*A). Peter
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As far as I recall, the AUX channels are multiplexed - and one can only store one at a given time. An upgrade to the NSV controller overcomes this limitation. Peter
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Hi Deepak, The exact BNC on whcih you can access the 'current' output depends on the type of signal access module (SAM) you have. 1) The small SAM-AM, which provides access to all the signals which go in & out the application modules like CAFM (the app module is ocnencted to this SAM by its 15pin micro-Dsub cable). Teh OUT-DC1 BNC is the
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Hi Mark, The force spectra on a saphire sample, with RTESP tip shoudl not show any deformation (or a tiny one). Deformation will be 'measured' if there is a hysteresis in your force spectrum. Is it possible that osmething else causes the hysteresis? Maybe the tip (or sample0 is a bit contaminated, and the contamination laye ris being deformed
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Hi Deepak, The v5 series of sofwtare do not inlcude the functionality to smeasure and store a user-selected parameter as a function of time. What you could maybe try is the following: go into the regular spectroscopy software (the one which is for exampel sued for force spectroscopy, or I-V spectroscopy). In this software, the user defines a 'ramp