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Hi Souier, This should be very simple. After you have engaged the probe on the sample surface in the "workflow" bar on the left of the screen the next node/ icon after engage should be "ramp". Click on this and it will take you to the force curve GUI which gives you three channels and a bunch of parameters on the left. Simply assign
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Hi P, If you have a Nanoscope V you have a High Speed Data Acquisition (HSDC) capability. It is the icon on the top bar that looks like a "seismometer" - a stylus tracing on a paper roll. In this option you can choose various signals to sample at 512khz, 6Mhz and 50Mhz. You can synchronize to End of Line, End of Frame etc.. while scanning
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Hi Arthur, One suggestion, if you are using amplitude modulation version of KPFM, make sure you scan a large enough area away from the overlap region. You need the whole cantilever (not tip) over Au, and again over Pd to get robust numbers for each. For a typical width cantilever this means scanning 60-80um across the overlap (centered at the overlap
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Hi nanoluna, Both of these quantities would be difficult to measure via AFM because of the discontinuity from macroscale to nanoscale, the level of forces involved, and the design of the instruments that do the traditional testing compared to the AFM. In principle one could envision looking at yield strength - though, this would be via indentation rather
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Hi Ozcarlosa, I'll have a colleague contact you directly, I think it will be a quicker route than back and forth on this forum to troubleshooting any hardware problems and talking through some of the PFM calibration/ implementation. Best regards
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Hi Lorenzo, 1) the 112nm/V deflection sensitivity value is nominal, more accurate would be to evaluate it by doing a force curve and measuring the gradient in the contact portion of the curve. 2) this is your choice based on the sample - if your sample was completely homogeneous across the scanned area then you could use the average value of the entire
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Hi Lorenzo, To measure the d33 coefficient from the PFM amplitude channel you need to perform the following calculation: {the value you wish to use from the PFM amplitude channel [V] multiplied by the deflection sensitivity of the cantilever you are using [nm/V]} divided by {16 x the applied bias you are using [V]} You can see by following the units
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Yes, a desiccator cabinet is a good storage option for these samples to try to keep water dissolved impurities in the environment building up on the surface over time. Best regards
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Hi Char135, If you have access to a snow jet (CO2 cleaner) this is a great and convenient way of cleaning samples. It removes large and small particles and even films and residues on the surface by various mechanisms (momentum transfer from the "snow", freeze fracturing etc... you can Google it and read up). Plasma treating these surfaces
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Hi Ozcarlosa, It is true - older MultiModes that have the NanoScope III controller and just the "Basic phase extender" are not optimal for PFM. You need at least the "Quadrex phase extender" or later NanoScope IV or V controllers (that have internal lock in amps). So this is why in fact you see publications that reference older MultiModes