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Dear Friends I have a Nanoscope IIIa Multimode AFM system with a signal access module and an extender box. Recently I have started facing a problem in tapping mode AFM. When i try to auto tune the AFM I get the following error message "Drive amplitude exceeded the safety limit while trying to attain the target amplitude. The tip may be broken or
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Hi Peter We carried out CAFM based I-V measurements as suggested by you. The signal access module seems to be of the kind mentioned in point 2 of your post above We used the AUX D channel on the SAM while the I-V spectrum of HOPG was being acquired and connected the AUX D channel to the 6517 electrometer. From the I-V spectra being displayed on the
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I am carrying out CAFM measurements of thin film samples using nanoscope IIIa equipped with a signal access module. We are carrying out both current mapping imaging and local I-V measurements at one position. We want to access the current signal (during local I-V measurements) out from the signal access module. This is required for the noise measurements
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Hi Peter I was able to get the value of friction as a function of time using the method of fake ramp suggested by you. thanks a lot Deepak
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Hi Bede I am using Nanoscope IIIa. The signal access module is connected between the extender and the controller Deepak
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Hi Friends This is regarding using the signal access module with Nanoscope III a controller. I am interested in retrieving the friction data of a sample from the nanoscope through the signal access module. Is the above possible and if yes what are steps to be followed. I have been trying to read the SAM manual but am not able to understand it clearly
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Hi Peter Thanks for the reply. I would like to clarify a few points regarding the method you have recommended: (1) I should go to the spectroscopy mode and keep the starting and ending ramp values the same. For example if I am ramping the voltage signal then starting and ending voltage value should be the same. (2) Thereafter I should keep the total
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Hi Peter Thanks for the information We are using software version 5.31 r1 Deepak
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Hello friends I was interested in measuring the variation in various properties (deflection, friction, current, etc) as a function of time at a particular spot on the sample surface using Nanoscope IIIa. What is the most reliable way to do the above Thanks Deepak
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I have some experience using KPFM in the two pass lift mode using Multimode (Nanoscope IIIa) AFM system. Is it possible to do KPFM in a single pass mode (frequency modulation) with this system. If yes, what steps need to be followed. thanks Deepak