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Hi Ozcarlosa, I see in another thread you asked a question about the NanoScope IV controller. If you have access to a system with a Nanoscope IV controller the PFM setup should be much more straightforward. With regards the cantilever holder: you have a choice in PFM to supply the AC bias to the tip or sample on most instruments. Being able to alternate
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Hi KomeijiKoishi, Your question has two key points really: 1. AFM-Solvent compatibility: This is simply a question of knowing the materials in your particular fluid cell (i.e. glass or PEEK fluid cell, viton or fluorosilicone gasket, gold cantilever clip? potting material/ adhesives used inside the cell that can contact the solvent). This is to make
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Hi DuckNamedFrank, This depends a little bit on the type, cantilever holder type, and even age of your AFM - on some holders you may actually be able to put in the probe and the back facing cantilevers wont make contact with the backside of the pocket - especially if you seat it forward a little bit. Most of the time though the rear facing levers will
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Hi Zhuola, I can help you out. This could be a quite involved answer so can you contact me at my email address: ian.armstrong@bruker.com You can attach the screenshot you had trouble uploading. Best regards
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Hi Jimmy, The choice of cantilever will revolve around a few things: resolution, spring constant, ease of functionalization... 1. For resolution you could use a sharp tip but this is usually not the best for funtionalizing as you may end up with too few bonding moieties at the tip end that can be damaged or wear quickly - hence a dulled probe or a small
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Hi Ozcarlosa, I believe the MultiMode needs at least a Quadrex phase extender (the successor to the Basic phase extender) to be able to do PFM. The Quadrex phase extender essentially has a fully fledged lock-in amp at its core. The basic extender had only a phase detector. When you do have the right electronic configuration in essence the photodetector
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Hi Zagari, The stiffest probes we manufacture are around 200N/m and on the Edge AFM detector arrangement these have a deflection sensitivity of around 70nm/V. I have in the past used these kind of probes with up to 10V deflection for indentation experiments. This puts you into the 150uN range. I would suggest that is a good maximum force limit. Cheers
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Hi Coldfire, If you have not done so already please contact Bruker support for this issue at the following email or phone number: AFMsupport@Bruker-Nano.com or 1-805-967-1400 Through the above we can have someone troubleshoot the problem and get you up and running in fluid.
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An image artefact at one edge of the image frame sounds like a rounding error. Check that the rounding parameter is not 0. If it is, give it a value such as 0.1 or 0.15. This may make the artefact disappear. Rounding simply allows the scanner to overshoot the recorded image frame (i.e. by nominally 10% 15%) such that the data you capture is at a linear
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Hi Michael, I did not calibrate the tip though I guess this could be done easily enough and added to the probe database. I just selected ScanAsyst-Air in the Setup screen as the spring constant, length etc... are fairly similar. I made sure I was using the maximum allowable amplitude in PFT (600nm peak to peak). I used the 2kHz modulation but slower