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To apply or view complete description, please follow this link: https://wwcareers-bruker.icims.com/jobs/1436/sales-applications-scientist%2c-afm/job?mobile=false&width=940&height=500&bga=true&needsRedirect=false Overview: As one of the world’s leading analytical instrumentation companies, Bruker covers a broad spectrum of advanced
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Hi Adam, Thanks for your question. Yes we have Windows 7 upgrade options for both NanoScope and NanoDrive controller based AFM systems. Full information is available from your local Bruker Nano Sales Representative who will contact you about this. Regards, Thomas
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SUMMARY OF RESPONSIBILITES: This position will drive the development of high throughput AFM applications for SME and Pharma by: · Working with end users to obtain relevant application data on the middle to high throughput AFM. · Analysis of large data sets to develop both results and best practices. · Development of online and offline
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The recent release of Bruker's PeakForce QNM® resolves this limitation and has successfully demonstrated improved results in terms of resolution, speed, ease-of-use, and quality of the information delivered. PeakForce QNM imaging of living cells provides both high-resolution and quantitative two-dimensional spatial maps of cell mechanics that
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Innova IRIS provides a complete solution for TERS with Bruker exclusive high performance IRIS TERS probes.
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A PeakForce KPFM study in a controlled <1ppm water and oxygen environment Join us as Bruker's Gregory Andreev demonstrates important new insights into graphene physics using the combination of PeakForce KPFM and the GloveBox Integrated System with guest speaker Aravind Vijayaraghavan from the University of Manchester's National Graphene Institute
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In this webinar we provide an introduction to a particularly powerful capability recently implemented by researchers on our AFMs: the ability to perform nanoscale IR imaging of materials using a technique called scattering Scanning Nearfield Optical Microscopy (sSNOM) . The XY resolution of sSNOM IR images surpasses 10nm beating the diffraction limit
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Atomic force microscopy (AFM) has been recognized since the mid-eighties [1] as an excellent technique to image a wide range of samples in their near-natural environment. Although the primary function of AFM is to generate three-dimensional (3D) profiles of the scanned surface, much more information can be delivered via this technique. In 1993, TappingMode
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In this webinar we take a look at the growth of Peak Force Tapping in AFM research and review some of the key publications in a wide range of fields that have made use of Peak Force Tapping. Topics range over material property mapping at the nanoscale in the fields of materials, high resolution imaging, bimolecular and cell biology, batteries, graphene