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EFM is possible with conductive tip holder, but I don't think it can be done in liquid. Ang Li
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why wouldn't you be the first one to publish such results?
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Hi, the procedure sent to your email. Ang Li
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Hi, 1. if you are using cross section mode, in the section figure, you can drag a horizotal line to the position where you wanna set as your zero and right click to select y translate. 2. not sure what you mean by truncate, if you wanna crop your image, you can select under filter->crop and split
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You can send me an email at Ang.li@bruker-nano.com, I will check it for you. Ang Li
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The most important paprameter you need for QNM is deflection sensitivity, which unfortunately can't be input offline to update QNM image, since the DMT modulus is a fitting parameter rather than a direct function of deflection sens. If you have HSDC data captured, you can update the deflection sens and other probe parameters like spring constant
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Simply speaking, DMT modulus stands for the elastic modulus calculated from DMT method (can also considered as young's modulus calculated from DMT method), and DMT method is the extended Hertzian method considering adhesion. So you can obtain DMT modulus from single force curve analysis by selecting 'including adhesion' and 'Hertzian
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Hi, you can contact prof Lim Chwee Teck from NUS at ctlim@nus.edu.sg on the experimental details, he has more than 10 years experience as well as one of the pioneers of using AFM based indentation/foce mapping method to study mechanical properties of electrospun nanofibers. He should be able to provide you useful experimental details since he used a
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Hi, Warren, I guess you should try flattening (the scan lines you saw in your image should be corrected in flattening but not in plane fit), you can still use first order without threshold, no need to run low pass for this purpose. Ang Li
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Hi, I guess Chunzeng suggested you glue the wafer on a sample puck that is usually for miultimode sample support, not to directly glue to sample chuck. Ang Li